- SIMS Europe Münster 2014:
“Quantitative Elemental Analytics of Photovoltaic CIGS Thin Films by the use of ToF-SIMS and ICP-MS”, K. Kaufmann, S. Meyer, E. Jarzembowski, C. Hagendor
- AOFA 17, 2013 Soest:
„Quantitative Elemental Analytics in Photovoltaic CIGS Thin Films by the use of TOFSIMS, XPS and ICP-MS”
- ILACOS 2013 Dresden:
„Characterization of laser structures in photovoltaic CIGS thin film systems“
- EU PVSEC Paris 2013:
“Influence of interfacial MoSe2 layer on ns laser scribing of Cu(In, Ga)Se2 solar cells” K. Kaufmann, M. Werner, E. Jarzembowski, S. Swatek
- PV-Symposium Bitterfeld 2013:
“The influence of Mo/CIGS interface properties on CIGS laser scribing“
- Nachwuchswissenschaftlerkonferenz 2013, Madgeburg:
“Influence of interfacial MoSe2 layer on ns laser scribing of Cu(In, Ga)Se2 solar cells” K. Kaufmann, M. Werner, E. Jarzembowski, S. Swatek
- EU PVSEC Frankfurt 2012:
“Characterization of laser structures in photovoltaic Cu(In, Ga)Se2 thin film systems”, K. Kaufmann, S. Swatek, M. Werner, C. Hagendorf
- SIMS Europe Münster 2012:
“Quantitative ToF-SIMS analysis of matrix elements and sodium in Cu(In, Ga)Se2 thin films”, K. Kaufmann, S. Meyer, S. Wahl, C. Hagendorf
